Contact Person: Antti Lassila
Desrcription of Expertise:
- Quantitative microscopy
- Traceable measurements
- Instrument calibration
Atomic Force Microscope (AFM) Metrology Atomic Force Microscope (MAFM) Laser diffractometer Stylus instrument Laser interferometer Calibration of transfer standards Line scale interferometer Fizeau interferometer
2.1.4 Atomic Force Microscopy (AFM) 2.1.8 Surface Profilometry 2.1.10 Other Imaging, Surface Profiling and Geometric Characterization 2.9.5 Other Optical Characterization
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