Name and Model: Woollam M-2000FI
Contact Person: David Cameron david.cameron@lut.fi Phone 0408352649
Year of Manufacture: 2007
Year of Installation: 2007
General Technical Information: Characterises thin films and material microstructure using polarised light
Desrcription of Use:
Measure refractive index and absorption of materials.
Measures thickness, surface roughness and multilayer thickness of thin films.
Key Features and Accessories:
Variable angle beam
UV to IR spectral range
Key Specifications: Wavelength range 210-1690 nm
Photograph:
Location: ASTRaL Lappeenranta University of Technology Patteristonkatu 3E
City: 50100 Mikkeli
Additional information:
Booking:
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