MiniSIMS

Organization: University of Eastern Finland » Department of Chemistry (Joensuu)

Milbrook MiniSIMS MC300 Mk2

Mika Suvanto

2003

2003

Secondary ion mass spectrometry, MiniSIMS

Mass spectral analysis of surfaces

surface analysis, detection of all elements, identification of organic species, imaging and depth profiling of surfaces

resolution: < 10 micrometers for conductors and < 50 micrometers for insulators

size of conductive samples: 12.5 mm diameter, 6.5 mm thick; size of insulating samples: 9.5 mm diameter, 6.5 mm thick

 

University of Eastern Finland, Joensuu campus, Department of Chemistry

Joensuu

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