Renishaw in Via Raman microscope
Mika Suvanto
2010
Renishaw in Via Reflex Spectrometer System for Raman spectral analysis for NIR and VIS excitation
Raman Spectrometer – Confocal Microscope with Integrated Atomic Force Microscope
Renishaw in Via Reflex Spectrometer System for Raman spectral analysis for NIR and VIS excitation. Including:
Spectrometer
- Rayleigh 785 nm excitation, Raman 100 cm-1
- Rayleigh 514 nm excitation, Raman 100 cm-1
- CCD array detector, peltier cooled to -70 ºC, deep depletion (576x384 pixels)
- 250 mm focal length spectrograph
- Dual gratings (2400 and 1200 l/mm)
- Laser spot continuously variable from 1 to 300 µm
Optical table interface kit
Microscope
- Research Grade Leica DMLM microscope, confocal measurements with 2.5 µm depth resolution using a x 100 objective
- Reflected light illumination
- x5, x20, x50 and x100 objectives
- Trinocular head with eyepieces and a color video camera
Lasers 785 nm Diod laser
- Renishaw Diod laser, 300 mW at 785 nm
- Argon Ion laser, 50 mW at 514 nm
Computer
XYZ stage
Fibre optic Probe, RP 10 for in Via reflex
Vibration Isolation package
AFM components (MultiView 2000TS, Integra Control electronics, Interface plate)