RF Sputtering System, Edwards + Leybold
Sergey Novikov
sergey.novikov(at)tkk.fi
1995
2007
Substrate Size:
100 mm dia. Max. Sample rotation. Holders for smaller samples are available.
Allowed Materials:
Metal, oxides (currently Al, Nb, Sn, Si, SiO2, ITO targets are available)
Forbidden Materials:
Elements with the high vapor pressure at the room temperature (Pb,Zn,Cd V-VI group), organic.
Availability and Cost:
Availability Class: F (Use allowed for all researchers with permission.)
Price Category: Low
RF sputtering and thermal evaporation.
1” magnetron + 1 place for thermal evaporation. Oxygen gas system for reactive sputtering.
• Deposition rate for metals up to 2nm/s, for oxides up to 0.5nm/s
• Maximum RF power 200W at 13MHz