Name and Model: UVISEL-VASE Horiba Jobin-Yvon
Contact Person: Hannu Moilanen
Year of Manufacture: 2009
Year of Installation: 2009
General Technical Information:
Desrcription of Use: Ellipsometer is used in measurement of the optical properties of surfaces and thin films. Also information about the thickness of the thin films can be obtained.
Key Features and Accessories: Versatile software for post-processing the ellipsometry data
Key Specifications: Non-destructive methodWavelength range: 190-2100 nmExtremely thin layers can be measured (< 10 nm)
Photograph:
Location: University of Oulu, Center of Microscopy and Nanotechnology, Cleanroom
City: Oulu
Additional information:
Booking:
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