X-ray Diffractometer (XRD)

Name and Model: Siemens D5000

Contact Person: N/A

Year of Manufacture:

Year of Installation:

General Technical Information:

Desrcription of Use: The X-ray diffractometer (XRD) is mostly used to analyze the compounds contained in powder samples. Other possible measurements are analysis of crystal structure, phase content, residual stress, dislocation densities, and the texture of the samples.

Key Features and Accessories:

Software and diffraction data library for analyzing the diffraction data

Key Specifications: Computer controlled system
X-ray tubes: Mo, Cu, Co, Cr
Goniometer: texture, theta-theta, theta-2theta
DiffractPLUS Basic, Topas, and Texture/ODF softwares

Photograph:

Location: University of Oulu, Center of Microscopy and Nanotechnology

City: Oulu