Name and Model: LEO 1550
Contact Person: Pertti Pääkkönen
Year of Manufacture: 1998
Year of Installation: 1998
General Technical Information: Scanning electron microscope with nanometer scale resolution.
Desrcription of Use: Imaging.
Key Features and Accessories: Field emission scanning electron microscope with 200 V – 30 kV beam energy, 20x to 900.000x magnification and 1 nm resolution at 20 kV.
Key Specifications:
Photograph:
Location:
City: Joensuu
Additional information: Long term usage without an operator is possible within co-operative projects.
Booking: Call contact person for service.
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