Scanning Electron Microscope

Organization: Mikpolis Oy

Hitachi S-4800

Aapo Nylén
Mobile +358 40 534 5127aapo.nylen@mamk.fi

2006

2006

Hitachi S-4800 Ultra-High Resolution Scanning Electron Microscope

High-Resolution Field-Emission scanning electron microscope (SEM), having a resolution of 1 nm. It is equipped with energy dispersive x-ray analysis (EDS) for determining chemical composition, BSE detector and STEM imaging equipment. Ideal for ultra-high resolution applications such as semiconductor, material studies and nanotechnology.

High resolution SEM and STEM imaging with X-ray Microanalysis

SEM:

Secondary electron image resolution1.0nm (at 15kV)
1.4nm (at 1kV, deceleration mode)
2.0nm (at 1kV, standard mode)
Backscattered electron image resolution3.0nm guaranteed (at 15kV YAG detector, option)
Electron optics 
Electron gunCold field emission electron source
Acc. voltage0.5 - 30kV (variable at 0.1kV/step)
MagnificationX 20 - X 800 000
Objective aperture4 opening, selectable and alignable outside the vacuum (Heater built-in)
DetectorsSecondary electron detector (upper/lower/upper + lower),
(noise compensation using a beam monitor),
(signal control function)
Transmitted electron detector (optional)
Energy dispersive X-ray detector (optional)
Specimen stageX: 0 ~ 110 mm

Y: 0 ~ 110mm

Z: 1.5 ~ 40mm

Tilt: -5  +70°

Rotation: 360°
 
Drive:PC controlled 5 axes motor drive 
Operation/displayPC/AT compatible, OS: Windows XP *
2 pcs of 19" Flat panel display
Scan modeNormal, Split/dual mag./line scan, position
set, spot, AAF, SAA, oblique
Frame memory640 x 480 pixels, 1.280 x 960 pixels,
2.560 x 1.920 pixels, 5.120 x 3.840 pixels
Image processingImage processing software, image filing software built-in
Image file formatBMP, TIFF, JPEG selectable
Scan speedTV, slow (0.5 ~ 40 s/frame) for viewing
Slow (40 ~ 320 s/frame) for recording
Image processingAutomatic image brightness & contrast,
raster rotation, autofocus, auto-stigmation,
averaging, frame integration, color display
Auto data recordingFilm numbering, acc. voltage, micron bar
with a scale, magnification, date, hours and
working distance
Electrical image shift±12µm (at W.D. = 8mm)
Vacuum systemFully automated pneumatic valve control
Energy saving ECO mode
lon pumps 3 sets
TMP 1 set
RP 1 set

EDS detector:

EDAX Sapphire Si(Li) detecting unit with Genesis Microanalysis Software

Mikkeli University of Applied Sciences
Materials technology

Mikkeli

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