Scanning Probe Microscope (SPM)

Name and Model: Veeco Instrument NanoScope V – MultiMode V

Contact Person: Esa Puukilainen

Year of Manufacture: 2007

Year of Installation: 2007

General Technical Information: A full range of SPM techniques for surface characterization of properties like 3D-topography, elasticity, friction, adhesion, and magnetic/electrical fields.

Desrcription of Use: High resolution surface characterization and patterning in both ambient and liquid environment under temperature and potential control.

Key Features and Accessories: High resolution SPM in both ambient and liquid environment. Tapping mode is especially suitable for soft samples. Phase imaging, force measurements, lateral force, conductive AFM, magnetic force, and electric force measurements give characteristic information about different surface properties. Heater package for temperature control up to 60°C, bipotentiostat for potential control in electrochemical AFM / STM.

Key Specifications:

Scan size        Lateral (XY) range       Vertical (Z) range
"E-scanner"      10 µm*10 µm             2,5 µm
"J-scanner"       125 µm*125 µm        5,0 µm

Noise <0,3 Å rms in vertical (Z) dimension with vibration isolation
Sample size 15 mm diameter, 5 mm thick
Flexible combinations of sample-per-line and lines-per-frame imaging up to 5120 x 5120
Up to 8 channels of data can be simultaneously collected

Photograph:

Location: University of Helsinki, Department of Chemistry, Laboratory of Inorganic Chemistry, A.I. Virtasen aukio 1, FI-00014 Helsinki, Finland

City: Helsinki