Name and Model: Bruker D8 Advance
Contact Person: Mikko Heikkilä
Year of Manufacture: 1998
Year of Installation: 1998
General Technical Information:
X-ray diffractometer
Desrcription of Use: X-ray diffraction (XRD) is used for phase identification of crystalline materials, X-ray reflectometry (XRR) is used for determination of thickness, roughness and density of thin films
Key Features and Accessories: Theta-theta goniometer with reflectometry sample stage, multilayer x-ray mirror (Göbel-mirror) for producing parallel beam needed for grazing incidence XRD and XRR.
Key Specifications:
Photograph:
Location: University of Helsinki, Department of Chemistry, Laboratory of Inorganic Chemistry, room C326
City: Helsinki
Additional information: Against time fee only if the person has been trained for measuring alone by contant person.
Booking: ”As a service” measurements are to be arranged with the contact person.
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