Laser diffractometer

Name and Model: Laser diffractometer

Contact Person: Virpi Korpelainen
virpi.korpelainen@mikes.fi 010-6054412 

Year of Manufacture:

Year of Installation:

General Technical Information: Accurate Littrow configuration laser diffractometer with 532 nm Nd:YAG laser.

Desrcription of Use:

Characterization of grating pitch

Calibration of 1D and 2D grids, which can be used in calibration of microscope scales and orthogonalities of the scales.

Key Features and Accessories:

Grating pitch characterization from ~300 nm to ~10 µm.

Key Specifications:

Uncertainties from 10 pm to subnanometre (depends on pitch and quality of the sample).

Photograph:

Location: Mittatekniikan keskus (MIKES)
Tekniikantie 1
02151 Espoo

City: Espoo