Atomic Force Microscope (AFM)

Name and Model: Digital Instruments, Dimension 3100 (Nanoscope V), Veeco

Contact Person: Antti Nuottajärvi
nuanka@jyu.fi +3583956002

Year of Manufacture:

Year of Installation: Controllers update 2008

General Technical Information: Atomic Force Microscope (AFM)
Measurements in liquid

Desrcription of Use: Tapping mode imaging
Contact mode imaging
Lateral force measurements
Nanomanipulation

Key Features and Accessories: Contact mode AFM
Tapping mode AFM
Phase Imaging
Nanoindenting / Scratching
Lateral Force Microscopy (LFM)
Force vs distance Curve
Liquid Cell
Calibrated x, y and z scales
High-speed data capture
Three independent lock-in amplifiers

Key Specifications: Sample size: up to 200mm in diameter
X-Y scan size: 90 µm x 90 µm
Z measurement range: 6 µm

Photograph:

Location: University of Jyväskylä, Nanoscience Center
Survontie 9, 40500 Jyväskylä

City: Jyväskylä