Raman Microscope

Name and Model: Bruker Senterra

Contact Person: Hannu Pakkanen
jusahok@jyu.fi

Year of Manufacture: 2006

Year of Installation: 2006

General Technical Information:

-SENTERRA R200-785

• a spectrometer module

• a microscope module.

Desrcription of Use:

SENTERRA combines a dispersive Raman spectrometer and a confocal microscope.

Possible fields of application are analyses of thin sample films, nanoparticles and surfaces

Key Features and Accessories:

Microscope module.

-Olympus BX51 reflected light microscope

-Video camera, Infinity 1

-Objectives:

• 20x,

• 50x,

• 100x

-motorized stage with servo-assisted z-control

• (positioning accuracy: 0.1um)

Spectrometer module

-Laser 785nm, 100mW

-Detector CCD, thermo-electrically cooled, (1024 x 256 pixel)

-Grating turret 2 gratings (for high resolution and wide range)

-Aperture Slit-type aperture: 25 x 1000um and 50 x 1000um

  Pinhole-type aperture: 25um and 50um

Key Specifications:

The implemented SureCal function calibrates the wavelength automatically.

Photograph:

Location: University of Jyväskylä
Survontie 9, 40500 Jyväskylä

City: Jyväskylä