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Atomic Force Microscopy (AFM)

Instruments

Atomic Force Microscope - Aalto University School of Science and Technology (TKK)

Atomic Force Microscope - University of Eastern Finland

Atomic Force Microscope - Aalto University School of Science and Technology (TKK)

Atomic Force Microscope - Savonia University of Applied Sciences

Atomic Force Microscope (AFM) - MIKES Centre for Metrology

Atomic Force Microscope (AFM) - University of Jyväskylä

Atomic Force Microscope (AFM) - University of Jyväskylä

Atomic Force Microscope (AFM) - University of Jyväskylä

Atomic Force Microscope (AFM) - Tampere University of Technology

Atomic Force Microscope (Veeco Dimension 5000) - Aalto University School of Science and Technology (TKK)

Atomic Force Microscope (Veeco MultiMode) - Aalto University School of Science and Technology (TKK)

Metrology Atomic Force Microscope (MAFM) - MIKES Centre for Metrology

Scanning probe microscope - Åbo Akademi University

Scanning Probe Microscope (SPM) - University of Helsinki

Expertise

Nanoindentation - Savonia University of Applied Sciences

Quantitative microscopy - MIKES Centre for Metrology

surface characterization / pintakarakterisointi - Åbo Akademi University

Thin film deposition and analysis - Lappeenranta University of Technology

Thin Films and Other Nanostructured Materials - University of Helsinki

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