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Other Imaging, Surface Profiling and Geometric Characterization
1. Nanofabrication
2. Characterization
2.1. Imaging, Surface Profiling and Geometric Characterization
2.1.1. Scanning Electron Microscopy (SEM)
2.1.2. Transmission Electron Microscopy (TEM)
2.1.3. Scanning Tunneling Microscopy (STM)
2.1.4. Atomic Force Microscopy (AFM)
2.1.5. Focused Ion Beam (FIB)
2.1.6. X-ray Tomography
2.1.7. Confocal Microscopy
2.1.8. Surface Profilometry
2.1.9. Particle Size Analysis and Counting (PCS, DLS)
2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
Instruments
Calibration of transfer standards - MIKES Centre for Metrology
Fizeau interferometer - MIKES Centre for Metrology
Fluorescence Microscope - University of Jyväskylä
Laser diffractometer - MIKES Centre for Metrology
Laser interferometer - MIKES Centre for Metrology
Line scale interferometer - MIKES Centre for Metrology
Optical Microscope - University of Jyväskylä
Stylus instrument - MIKES Centre for Metrology
Stylus Profilometer - Mikpolis Oy
Expertise
Quantitative microscopy - MIKES Centre for Metrology
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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