Suomeksi
Frontpage
Info
Capability Classification
Research Institutes
Companies
Search
Contact
Links
Images
Search FinDNano
Frontpage
» Capability Classification
Rutherford Backscattering Spectrometry (RBS)
1. Nanofabrication
2. Characterization
2.4. Elemental analysis
2.4.1. Electron Spectroscopy (XPS/ESCA, AES, SAM)
2.4.2. X-ray Analysis (EDS/EDX, WDX, XRF)
2.4.3. Optical Spectroscopy (LIPS, ICP-OES)
2.4.4. Mass Spectrometry (SIMS, ICP-MS, LA-ICP-MS, TOF)
2.4.5. Rutherford Backscattering Spectrometry (RBS)
Instruments
Rutherford Backscattering Spectrometry (RBS) - University of Jyväskylä
2.4.6. Elastic Recoil Detection (ERDA, HFS)
2.4.7. Inelastic Neutron Scattering (INS)
2.4.8. Deep Level Spectroscopy (DLS, DLTS)
2.4.9. Other Elemental analysis
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
Login
Powered by
Evianet Solutions Oy