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» Capability Classification
Inelastic Neutron Scattering (INS)
1. Nanofabrication
2. Characterization
2.4. Elemental analysis
2.4.1. Electron Spectroscopy (XPS/ESCA, AES, SAM)
2.4.2. X-ray Analysis (EDS/EDX, WDX, XRF)
2.4.3. Optical Spectroscopy (LIPS, ICP-OES)
2.4.4. Mass Spectrometry (SIMS, ICP-MS, LA-ICP-MS, TOF)
2.4.5. Rutherford Backscattering Spectrometry (RBS)
2.4.6. Elastic Recoil Detection (ERDA, HFS)
2.4.7. Inelastic Neutron Scattering (INS)
2.4.8. Deep Level Spectroscopy (DLS, DLTS)
2.4.9. Other Elemental analysis
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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