Suomeksi

FinDNano
Frontpage Info Capability Classification Research Institutes Companies Search Contact Links Images  

FinDNanoSearch FinDNano


Frontpage » Capability Classification

Other Electrical and Magnetic Characterization

  • 1. Nanofabrication
  • 2. Characterization
  • 2.8. Electrical and Magnetic Characterization
  • 2.8.12. Other Electrical and Magnetic Characterization
    • Instruments
    Mapping Controlled Atmosphere Kelvin-Probe System - Aalto University School of Science and Technology (TKK)
    Wirebonder - Savonia University of Applied Sciences

    Expertise
    photovoltage/photocurrent measurements - Tampere University of Technology
    Quantum metrology and electrical measurements - MIKES Centre for Metrology
    Wirebonding - Savonia University of Applied Sciences
  • 2.8.1. Capacitance Measurements
  • 2.8.2. Current-Voltage Measurements
  • 2.8.3. Surface Resistance Measurements
  • 2.8.4. ECV Doping Profiling (Polaron)
  • 2.8.5. Hall Measurements
  • 2.8.6. Electroluminescence Spectroscopy (EL)
  • 2.8.7. Magnetometry
  • 2.8.8. Impedance Spectroscopy
  • 2.8.9. Cathodoluminescence
  • 2.8.10. Opto-acoustic Spectroscopy
  • 2.8.11. Ultraviolet Photoelectron Spectroscopy (UPS)
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
Login
Sitemap
Powered by Evianet Solutions Oy