Suomeksi

FinDNano
Frontpage Info Capability Classification Research Institutes Companies Search Contact Links Images  

FinDNanoSearch FinDNano


Frontpage » Capability Classification

Spectrophotometry

  • 1. Nanofabrication
  • 2. Characterization
  • 2.9. Optical Characterization
  • 2.9.1. Scanning Near-field Optical Microscopy (SNOM)
  • 2.9.2. Spectroscopic Ellipsometry (SE, VASE)
  • 2.9.3. Photoluminescence Spectroscopy (PL)
  • 2.9.4. Spectrophotometry
    • Instruments
    Spectrophotometer - University of Oulu
    Spectrophotometer - University of Jyväskylä
    UV/Vis/NIR spectrometer (Perkin Elmer Lambda 950) - Aalto University School of Science and Technology (TKK)

    Expertise
    Photophysics and photochemistry of nanostructures - Tampere University of Technology
  • 2.9.5. Other Optical Characterization
  • 3. Computation, Modeling and Simulation
  • 4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
Login
Sitemap
Powered by Evianet Solutions Oy