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» Capability Classification
Scanning Electron Microscopy (SEM)
1. Nanofabrication
2. Characterization
2.1. Imaging, Surface Profiling and Geometric Characterization
2.1.1. Scanning Electron Microscopy (SEM)
Instruments
E-beam Lithography Tool / SEM - University of Jyväskylä
E-beam Lithography Tool / SEM - University of Jyväskylä
Electron Beam Microscope/Electron Beam Lithography System - Aalto University School of Science and Technology (TKK)
Field emission scanning electron microscope (FEG-SEM) - Tampere University of Technology
Field emission scanning electron microscope (FESEM) - University of Helsinki
Field Emission Scanning Electron Microscope (FESEM) - University of Oulu
Field emission scanning electron microscope, FE-SEM - University of Eastern Finland
Focused Ion Beam (FIB) System - University of Oulu
Scanning Electron Microscope - University of Eastern Finland
Scanning electron microscope - University of Eastern Finland
Scanning Electron Microscope - Mikpolis Oy
Scanning Electron Microscope - Aalto University School of Science and Technology (TKK)
Scanning Electron Microscope (JEOL JSM-7500F) - Aalto University School of Science and Technology (TKK)
Scanning Electron Microscope (SEM) - University of Jyväskylä
Scanning electron microscope (SEM) - Tampere University of Technology
Scanning Electron Microscope (SEM) - University of Jyväskylä
Scanning electron microscope (SEM) - Tampere University of Technology
Scanning Electron Microscope (SEM) - University of Oulu
Scanning Electron Microscope (SEM) - University of Jyväskylä
Scanning Electron Microscope (SEM) and Energy Dispersive X-ray Spectrometer (EDS) - Teknologiakeskus KETEK Oy
Scanning electron microscope + e-beam lithography system - Savonia University of Applied Sciences
SEM (Scanning Electron Microscope) - Åbo Akademi University
Expertise
Chemical and physical characterisation on the nano-scale of surfaces from natural materials. - Åbo Akademi University
Thin film deposition and analysis - Lappeenranta University of Technology
Thin Films and Other Nanostructured Materials - University of Helsinki
2.1.2. Transmission Electron Microscopy (TEM)
2.1.3. Scanning Tunneling Microscopy (STM)
2.1.4. Atomic Force Microscopy (AFM)
2.1.5. Focused Ion Beam (FIB)
2.1.6. X-ray Tomography
2.1.7. Confocal Microscopy
2.1.8. Surface Profilometry
2.1.9. Particle Size Analysis and Counting (PCS, DLS)
2.1.10. Other Imaging, Surface Profiling and Geometric Characterization
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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