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» Capability Classification
X-ray Analysis (EDS/EDX, WDX, XRF)
1. Nanofabrication
2. Characterization
2.4. Elemental analysis
2.4.1. Electron Spectroscopy (XPS/ESCA, AES, SAM)
2.4.2. X-ray Analysis (EDS/EDX, WDX, XRF)
Instruments
Electron Probe Microanalyzer (EPMA) - University of Oulu
Energy dispersive X-ray analysis, EDS - University of Eastern Finland
Energy dispersive X-ray microanalysis system (EDX) - University of Helsinki
Energy Filtered Transmission Electron Microscope (EFTEM) - University of Oulu
Field emission scanning electron microscope (FEG-SEM) - Tampere University of Technology
Field Emission Scanning Electron Microscope (FESEM) - University of Oulu
Focused Ion Beam (FIB) System - University of Oulu
Scanning electron microscope (SEM) - Tampere University of Technology
Scanning Electron Microscope (SEM) - University of Oulu
Scanning Electron Microscope (SEM) and Energy Dispersive X-ray Spectrometer (EDS) - Teknologiakeskus KETEK Oy
Transmission electron microscope - University of Eastern Finland
Transmission electron microscope - Tampere University of Technology
X-ray fluorescence spectrometer (XRF) - University of Oulu
Expertise
Thin film deposition and analysis - Lappeenranta University of Technology
Thin Films and Other Nanostructured Materials - University of Helsinki
2.4.3. Optical Spectroscopy (LIPS, ICP-OES)
2.4.4. Mass Spectrometry (SIMS, ICP-MS, LA-ICP-MS, TOF)
2.4.5. Rutherford Backscattering Spectrometry (RBS)
2.4.6. Elastic Recoil Detection (ERDA, HFS)
2.4.7. Inelastic Neutron Scattering (INS)
2.4.8. Deep Level Spectroscopy (DLS, DLTS)
2.4.9. Other Elemental analysis
3. Computation, Modeling and Simulation
4. Other
MIKTECH OY - Graanintie 5, 50190 Mikkeli FINLAND
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